Deutsch Intern
    Wilhelm Conrad Röntgen Research Center for Complex Material Systems

    Scanning electron microscope (Zeiss GeminiSEM 450)

    Specifications

    • thermal Schottky emitter
    • GEMINI II electron optics
    • local charge compensation
    • beam blanker
    • NPVE Advanced
    • Resolution: 0.7 nm (15 kV), 1,1 nm (1 kV)

    Location

    • P5/NBAA clean room

    Pulications

    Second harmonic generation from plasmonic hotspots by controlled local symmetry breaking
    J. Meier, L. Zurak, A. Locatelli, T.Feichtner, R. Kullock, B. Hecht, ACS Nano,
    in review (2023), arXiv:2210.14105  

    Light-driven microdrones
    X. Wu, R. Ehehalt, G. Razinskas, T. Feichtner, J. Qin & B. Hecht
    Nature Nanotech. 17, 477–484 (2022), https://doi.org/10.1038/s41565-022-01099-z

    Tunable Nanoplasmonic Photodetectors
    P. Pertsch, R. Kullock, V. Gabriel, L. Zurak, M. Emmerling, and B. Hecht,
    Nano Lett. 22, 6982–6987 (2022).  https://doi.org/10.1021/acs.nanolett.2c01772

    Color-Switchable Subwavelength Organic Light-Emitting Antennas
    P. Grimm, S. Zeißner, M. Rödel, S. Wiegand, S. Hammer, M. Emmerling, E. Schatz, R. Kullock, J. Pflaum, and Bert Hecht
    Nano Lett. 22, 1032–1038 (2022). https://doi.org/10.1021/acs.nanolett.1c03994

    Development of Rotaxanes as E-Field-Sensitive Superstructures in Plasmonic Nano-Antennas
    Jucker, Laurent; Ochs, Maximilian; Kullock, René; Aeschi, Yves; Hecht, Bert; Mayor, Marcel
    Organic Materials (2022). 4(03) 127–136. DOI: 10.1055/a-1927-8947

    The patterning toolbox FIB-o-mat: Exploiting the full potential of focused helium ions for nanofabrication
    V. Deinhart, L.-M. Kern, J.N. Kirchhof, S. Juergensen, J. Sturm, E. Krauss, T. Feichtner, S. Kovalchuk, M. Schneider, D. Engel, B. Pfau, B. Hecht, K.I. Bolotin, S. Reich, K. Höflich,
    Beilstein Journal of Nanotechnology 12 304–318 (2021). https://www.beilstein-journals.org/bjnano/articles/12/25

    Nanoscale Electrical Excitation of Distinct Modes in Plasmonic Waveguides
    M. Ochs, L. Zurak, E. Krauss, J. Meier, M. Emmerling, R. Kullock, B. Hecht
    Nano Lett. 21, 4225–4230 (2021). https://doi.org/10.1021/acs.nanolett.1c00182