Sitemap
- Home
- Executive Board
- Principal Investigators
-
Joint Analytical Laboratory
- Buchungskalender RCCM-Geräte
- Nutzerordnung
- Scanning electron microscope (Zeiss GeminiSEM 450)
- Zeiss He/Ne/Ga scanning ion microscope (Orion nanoFab)
- HR-XRD (Bruker)
- XRPD
- TEM (FEI Titan 80-300)
- Dual-Beam System (FEI Helios Nanolab)
- fs pump-probe Spectroscope
- SAXS/WAXS
- FE-SEM (Zeiss Ultra Plus)
- SEM (JEOL JSM-7100F) and XRM (XRM II)
- Publications
- Cooperations