FE-SEM (Zeiss Ultra Plus)
Field Emission Scanning Electron Microscope (Zeiss Ultra Plus)
Specifications
- Resolution:
- 0.8 nm (30 kV) [STEM mode]
- 0.8 nm (15 kV) - Magnification: 12 - 1 000 000
- Acceleration Voltage: 0.02 kV - 30 kV
- Probe Current:
- Configuration 1: 4 pA – 20 nA
- Configuration 2: 12 pA – 100 nA - STEM-Detector
- EDX-Detector
- Charge Compensator
- Micromanipulators (Kleindiek)
- Cryo-Preparation- and Transfer-System (Quorum)
Contact persons | Location |
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Examples
Correcting for AFM tip induced topography distortions in protein-DNA samples
I. Tessmer et al.
submitted to Ultramicroscopy (2011)
Alkaline Earth Imidazolate Coordination Polymers by Solvent Free Melt Synthesis as Potential Host Lattices for Rare Earth Photoluminescence: [AE(Im)2(ImH)2-3], Mg, Ca, Sr, Ba, x = 1–2
A. Zurawski, J.-C. Rybak, L. V. Meyer, P. R. Matthes, V. Stepanenko, N. Dannenbauer, F. Würthner and K. Müller-Buschbaum
Dalton Trans. 41, 4067 (2012)
Self-Assembly and Social Self-Sorting in mixtures of Polar and Nonpolar Oligophenyleneethynylene Derivatives
G. Fernández et al.
submitted to J. Am. Chem. Soc. (2012)
